{"@context":"http://iiif.io/api/presentation/2/context.json","@id":"https://repo.library.stonybrook.edu/cantaloupe/iiif/2/manifest.json","@type":"sc:Manifest","label":"Forward Analysis of Transversely Isotropic Thin Film by Indentation Method","metadata":[{"label":"dc.description.sponsorship","value":"This work is sponsored by the Stony Brook University Graduate School in compliance with the requirements for completion of degree."},{"label":"dc.format","value":"Monograph"},{"label":"dc.format.medium","value":"Electronic Resource"},{"label":"dc.identifier.uri","value":"http://hdl.handle.net/11401/76374"},{"label":"dc.language.iso","value":"en_US"},{"label":"dc.publisher","value":"The Graduate School, Stony Brook University: Stony Brook, NY."},{"label":"dcterms.abstract","value":"Instrument indentation based methods for determining elasto-plastic properties of bulk specimen or thin film have received considerable and continue growing attention for recent decades, due to its simplicity, operability, and potential applications. However, the researches of transversely isotropic thin film are still at the beginning stage. In order to obtain a deeper understand of the relationship between P&ndashh curve and thin film properties, both dimensional analysis method and finite element method were applied in the present work. Extensive computational analysis of 630 sets of materials properties was carried out here. Through systematical studies, a more reasonable and intrinsic relationship, between indenter displacement h and the force P on it, was revealed. Also, an effect of materials transverse isotropic properties was summarized. Moreover, accurate and powerful forward analysis functions were established at the end of this thesis. These functions were, then, tested and mismatches were studied."},{"label":"dcterms.available","value":"2017-09-20T16:50:08Z"},{"label":"dcterms.contributor","value":"Koga, Tadanori"},{"label":"dcterms.creator","value":"Zhi, Zheng"},{"label":"dcterms.dateAccepted","value":"2017-09-20T16:50:08Z"},{"label":"dcterms.dateSubmitted","value":"2017-09-20T16:50:08Z"},{"label":"dcterms.description","value":"Department of Materials Science and Engineering."},{"label":"dcterms.extent","value":"61 pg."},{"label":"dcterms.format","value":"Application/PDF"},{"label":"dcterms.identifier","value":"http://hdl.handle.net/11401/76374"},{"label":"dcterms.issued","value":"2013-12-01"},{"label":"dcterms.language","value":"en_US"},{"label":"dcterms.provenance","value":"Made available in DSpace on 2017-09-20T16:50:08Z (GMT). No. of bitstreams: 1\nZhi_grad.sunysb_0771M_11383.pdf: 7010523 bytes, checksum: 5c2bebc2ca8d3f5209565e69ab0e2704 (MD5)\n  Previous issue date:    1"},{"label":"dcterms.publisher","value":"The Graduate School, Stony Brook University: Stony Brook, NY."},{"label":"dcterms.subject","value":"Materials Science"},{"label":"dcterms.title","value":"Forward Analysis of Transversely Isotropic Thin Film by Indentation Method"},{"label":"dcterms.type","value":"Thesis"},{"label":"dc.type","value":"Thesis"}],"description":"This manifest was generated dynamically","viewingDirection":"left-to-right","sequences":[{"@type":"sc:Sequence","canvases":[{"@id":"https://repo.library.stonybrook.edu/cantaloupe/iiif/2/canvas/page-1.json","@type":"sc:Canvas","label":"Page 1","height":1650,"width":1275,"images":[{"@type":"oa:Annotation","motivation":"sc:painting","resource":{"@id":"https://repo.library.stonybrook.edu/cantaloupe/iiif/2/11%2F70%2F52%2F117052824120281496383477446640619540138/full/full/0/default.jpg","@type":"dctypes:Image","format":"image/jpeg","height":1650,"width":1275,"service":{"@context":"http://iiif.io/api/image/2/context.json","@id":"https://repo.library.stonybrook.edu/cantaloupe/iiif/2/11%2F70%2F52%2F117052824120281496383477446640619540138","profile":"http://iiif.io/api/image/2/level2.json"}},"on":"https://repo.library.stonybrook.edu/cantaloupe/iiif/2/canvas/page-1.json"}]}]}]}