{"@context":"http://iiif.io/api/presentation/2/context.json","@id":"https://repo.library.stonybrook.edu/cantaloupe/iiif/2/manifest.json","@type":"sc:Manifest","label":"Characterizations of Defects in Bulk Sapphire","metadata":[{"label":"dc.description.sponsorship","value":"This work is sponsored by the Stony Brook University Graduate School in compliance with the requirements for completion of degree."},{"label":"dc.format","value":"Monograph"},{"label":"dc.format.medium","value":"Electronic Resource"},{"label":"dc.identifier.uri","value":"http://hdl.handle.net/11401/76365"},{"label":"dc.language.iso","value":"en_US"},{"label":"dc.publisher","value":"The Graduate School, Stony Brook University: Stony Brook, NY."},{"label":"dcterms.abstract","value":"Defects would effect the optical properties and operation performances of sapphire single crystal material. Further understanding the defects structure and origins in sapphire plays a crucial role. This study is focusing on analyzing the structure of linear, 2D and 3D defects using the X-ray topography technique. Several other techniques such as etch pits method and X-ray reticulography are also employed to revealing the properties of dislocations and stress distribution around certain defect feature."},{"label":"dcterms.available","value":"2017-09-20T16:50:07Z"},{"label":"dcterms.contributor","value":"Raghothamachar, Balaji"},{"label":"dcterms.creator","value":"Yang, Yu"},{"label":"dcterms.dateAccepted","value":"2017-09-20T16:50:07Z"},{"label":"dcterms.dateSubmitted","value":"2017-09-20T16:50:07Z"},{"label":"dcterms.description","value":"Department of Materials Science and Engineering."},{"label":"dcterms.extent","value":"62 pg."},{"label":"dcterms.format","value":"Application/PDF"},{"label":"dcterms.identifier","value":"http://hdl.handle.net/11401/76365"},{"label":"dcterms.issued","value":"2012-12-01"},{"label":"dcterms.language","value":"en_US"},{"label":"dcterms.provenance","value":"Made available in DSpace on 2017-09-20T16:50:07Z (GMT). No. of bitstreams: 1\nYang_grad.sunysb_0771M_11241.pdf: 5225169 bytes, checksum: fe852614d27cb2953442896ddda91571 (MD5)\n  Previous issue date:    1"},{"label":"dcterms.publisher","value":"The Graduate School, Stony Brook University: Stony Brook, NY."},{"label":"dcterms.subject","value":"dislocations, sapphire, X-ray Topography"},{"label":"dcterms.title","value":"Characterizations of Defects in Bulk Sapphire"},{"label":"dcterms.type","value":"Thesis"},{"label":"dc.type","value":"Thesis"}],"description":"This manifest was generated dynamically","viewingDirection":"left-to-right","sequences":[{"@type":"sc:Sequence","canvases":[{"@id":"https://repo.library.stonybrook.edu/cantaloupe/iiif/2/canvas/page-1.json","@type":"sc:Canvas","label":"Page 1","height":1650,"width":1275,"images":[{"@type":"oa:Annotation","motivation":"sc:painting","resource":{"@id":"https://repo.library.stonybrook.edu/cantaloupe/iiif/2/10%2F84%2F22%2F108422210775244958138432107657788153554/full/full/0/default.jpg","@type":"dctypes:Image","format":"image/jpeg","height":1650,"width":1275,"service":{"@context":"http://iiif.io/api/image/2/context.json","@id":"https://repo.library.stonybrook.edu/cantaloupe/iiif/2/10%2F84%2F22%2F108422210775244958138432107657788153554","profile":"http://iiif.io/api/image/2/level2.json"}},"on":"https://repo.library.stonybrook.edu/cantaloupe/iiif/2/canvas/page-1.json"}]}]}]}