{"@context":"http://iiif.io/api/presentation/2/context.json","@id":"https://repo.library.stonybrook.edu/cantaloupe/iiif/2/manifest.json","@type":"sc:Manifest","label":"Thin Films for X-ray Optics","metadata":[{"label":"dc.description.sponsorship","value":"This work is sponsored by the Stony Brook University Graduate School in compliance with the requirements for completion of degree."},{"label":"dc.format","value":"Monograph"},{"label":"dc.format.medium","value":"Electronic Resource"},{"label":"dc.identifier.uri","value":"http://hdl.handle.net/11401/76234"},{"label":"dc.language.iso","value":"en_US"},{"label":"dc.publisher","value":"The Graduate School, Stony Brook University: Stony Brook, NY."},{"label":"dcterms.abstract","value":"X-ray optics are a subset of optics that are used to focus, filter, or otherwise manipulate light in the x-ray range.  Visible light and x-rays propagate through space in the same manner because they are both electromagnetic radiation, but in contrast to visible light, x-rays interact very weakly with matter because the refractive index of all materials is very close to 1 at x-ray wavelengths. This weak interaction with matter has led to the global proliferation of both laboratory and accelerator based x-ray instruments that have the advantages of high penetration power, allowing the study of thick specimens, buried or hidden structures, and in-situ studies.  The strong penetrating power of x-rays also means that x-ray optics need to be designed very differently from their visible-light analogues. Focusing x-rays with refraction requires an entire array of lens instead of a single element, each contributing a minute amount of focusing to the system.  In contrast to their visible light counterparts, diffractive optics require a certain depth along the optical axis in order to provide sufficient phase shift.  Mirrors reflect only at very shallow angles. In order to increase the angle of incidence, contribution from constructive interference within many layers needs to be collected.  This requires a multilayer coating. Thin films have become a central ingredient for many x-ray optics due to the ease of which material composition and thickness can be controlled.   Chapter 1 starts with a short introduction and survey of the field of x-ray optics.  This begins with an explanation of reflective multilayers.  Focusing optics are presented next, including mirrors, zone plates, refractive lenses, and multilayer Laue lens (MLL).  The strengths and weaknesses of each \u00e2\u20ac\u0153species\u00e2\u20ac  of optic are briefly discussed, alongside fabrication issues and the ultimate performance for each.  Practical considerations on the use of thin-films for x-ray optics fabrication span a wide array of topics including material systems selection and instrumentation design.  Sputter deposition is utilized exclusively for the work included herein because this method of thin-film deposition allows a wide array of deposition parameters to be controlled.  This chapter also includes a short description of two deposition systems I have designed. Chapter 2 covers a small sampling of some of my work on reflective multilayers, and outlines two of the deposition systems I have designed and built at the Advanced Photon Source.  A three-stripe double multilayer monochromator is presented as a case study in order to detail specifications, fabrication, and performance of this prolific breed of x-ray optics.  The APS Rotary Deposition System was the first deposition system in the world designed specifically for multilayer Laue lens, however my advancements in MLL fabrication technology led to new generations of deposition instruments that were better suited.  In order to re-purpose the APS Rotary Deposition System, a concept to upgrade the machine with a suborbital planetary is discussed.  The APS Modular Deposition System (MDS) is the state of the art instrument that was designed to keep APS at the forefront of x-ray optics technology for the foreseeable future.  By including flexibility in the design, the machine is ideally suited for research on all types of multilayers and thin-films for x-ray optics applications.  A new method for in-situ surface metrology is presented which relies on the infrastructure provided by the MDS.  The chapter concludes with discussion on several types of reflective multilayers that span a broad range of x-ray wavelengths, from soft x-rays (below 5-10 keV) to hard x-rays (above 5-10keV). A method for fabrication of precision elliptically-figured mirrors called profile coating (conceived at the APS) is covered in Chapter 3. Profile-coating is a technique where a specially shaped mask is designed to partially obscure the sputtering source in order to produce a coating with a specially defined film thickness profile perpendicular to substrate translation.  Source shape modeling and mask calculation is presented. Initially, Au was used as the filler material for profile coating, however I found that Pt offered better performance.  Rh has also been used to fabricate profile-coated KB mirrors.  Performance and commissioning results for the APS profile-coating deposition system (another machine designed by myself) is included.   Chapter 4 covers my work on multilayer Laue lens.  Motivation and current status are presented, and the nomenclature we devised to name the various MLL types is listed.  Following this, a theoretical overview is provided.  Important advancements I have spearhead in this field are included, such as the introduction of metal silicides, reactive sputtering for stress reduction, marker layers, and the first ever wedged MLL fabrication.  My early successes with these optics led the National Synchrotron Light Source-II to commission new laboratories which I designed explicitly for development of MLL. Several world records are highlighted, including performance of the world\u00e2\u20ac\u2122s first wedged MLL, and the achievement of an MLL over 100 \u00c2\u00b5m thick with 15,170 layers in the stack.  My efforts culminated in MLL optics that provide the highest resolution in the world of below 15 nm x 15 nm which is available for routine user operations at the Hard X-ray Nanoprobe at NSLS-II.  Finally, an outlook on the future of MLL is discussed.   My optics have been deployed at facilities and beamlines spanning multiple continents.  Optics specifically discussed here were used at beamlines 1BM, 2ID, 7BM, 12BM, 16ID, 26ID, 32-ID 34ID at the APS, and 3-ID at the NSLS-II."},{"label":"dcterms.available","value":"2017-09-20T16:49:46Z"},{"label":"dcterms.contributor","value":"Gersappe, Dilip"},{"label":"dcterms.creator","value":"Conley, Raymond"},{"label":"dcterms.dateAccepted","value":"2017-09-20T16:49:46Z"},{"label":"dcterms.dateSubmitted","value":"2017-09-20T16:49:46Z"},{"label":"dcterms.description","value":"Department of Materials Science and Engineering"},{"label":"dcterms.extent","value":"164 pg."},{"label":"dcterms.format","value":"Monograph"},{"label":"dcterms.identifier","value":"http://hdl.handle.net/11401/76234"},{"label":"dcterms.issued","value":"2017-05-01"},{"label":"dcterms.language","value":"en_US"},{"label":"dcterms.provenance","value":"Made available in DSpace on 2017-09-20T16:49:46Z (GMT). No. of bitstreams: 1\nConley_grad.sunysb_0771E_13299.pdf: 7191815 bytes, checksum: f594c61c04810895006f6c859d714201 (MD5)\n  Previous issue date:    1"},{"label":"dcterms.publisher","value":"The Graduate School, Stony Brook University: Stony Brook, NY."},{"label":"dcterms.subject","value":"Optics -- Materials Science -- Engineering"},{"label":"dcterms.title","value":"Thin Films for X-ray Optics"},{"label":"dcterms.type","value":"Dissertation"},{"label":"dc.type","value":"Dissertation"}],"description":"This manifest was generated dynamically","viewingDirection":"left-to-right","sequences":[{"@type":"sc:Sequence","canvases":[{"@id":"https://repo.library.stonybrook.edu/cantaloupe/iiif/2/canvas/page-1.json","@type":"sc:Canvas","label":"Page 1","height":1650,"width":1275,"images":[{"@type":"oa:Annotation","motivation":"sc:painting","resource":{"@id":"https://repo.library.stonybrook.edu/cantaloupe/iiif/2/67%2F97%2F39%2F67973926440013856408148477715026238443/full/full/0/default.jpg","@type":"dctypes:Image","format":"image/jpeg","height":1650,"width":1275,"service":{"@context":"http://iiif.io/api/image/2/context.json","@id":"https://repo.library.stonybrook.edu/cantaloupe/iiif/2/67%2F97%2F39%2F67973926440013856408148477715026238443","profile":"http://iiif.io/api/image/2/level2.json"}},"on":"https://repo.library.stonybrook.edu/cantaloupe/iiif/2/canvas/page-1.json"}]}]}]}